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1 article(s) from Locatelli, A.

Cathode lens spectromicroscopy: methodology and applications

T. O. Menteş,
G. Zamborlini,
A. Sala and
A. Locatelli

Beilstein J. Nanotechnol. 2014, 5, 1873–1886, doi:10.3762/bjnano.5.198

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Figure 1: The simplified schematic description of a) XPEEM, b) LEEM. The energy analyzer (EA) is optional in ...

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Figure 2: Energy dependence of the (00) beam intensity for clean, Fe-covered and O-covered W(110) surfaces. T...

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Figure 3: a) Illustration of imaging spectroscopy in XAS mode. Fe nanowires on W(110) appear dark on the left...

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Figure 4: The SPELEEM instrument at the Nanospectroscopy beamline, Elettra Sincrotrone, Trieste. The sketch o...

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Figure 5: a) The energy distribution of the electron beam emitted from the LaB₆ source acquired by keeping th...

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Figure 6: Tungsten 4f_7/2 core level spectrum from a clean W(110) surface acquired in dispersive plane mode. T...

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Figure 7: Lateral resolution in LEEM. The inset shows a Ni monolayer island (dark) on W(110). The profile in ...

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Figure 8: LEEM images at a start voltage of 12 eV illustrating the evolution of the graphene/Ir(100) interfac...

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Figure 9: Graphene on Au/Ir(100) (left column) and Ir(100) (right column). (a) μ-ARPES near E_F; the high symm...

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Figure 10: a) LEEM images (2 μm diameter) of monolayer Pd stripes on W(110). The lower left panel shows Pd on ...

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Figure 11: a) Magnetite islands and the FeO wetting layer on Ru(0001). Top panels show the island and magnetiz...

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Review

Published 27 Oct 2014

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